Chroma 17011 可編程電池充放電測試系統

Chroma 17011 可編程(cheng)電(dian)池充(chong)放(fang)電(dian)測試(shi)系統(tong)  Chroma 17011 可編程(cheng)充(chong)放(fang)電(dian)系統(tong)是專為鋰離子二(er)次電(dian)池與電(dian)氣二(er)重層(ceng)電(dian)容(EDLC)測試(shi)而(er)開發的(de)高精密(mi)設備(bei)，適合用(yong)(yong)于壽命(ming)試(shi)驗(yan)、產(chan)品(pin)進出貨檢驗(yan)、產(chan)品(pin)特性篩(shai)選(xuan)、材料實驗(yan)、小批(pi)量(liang)試(shi)產(chan)等用(yong)(yong)途。普利華科技可以上門，量(liang)身定制(zhi)方案供選(xuan)擇。

電池直流內阻測試應用 
內電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)值的(de)(de)(de)大(da)小關系(xi)著動力電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)可應用充/放電(dian)(dian)(dian)(dian)(dian)(dian)流 大(da)小，內阻(zu)越大(da)效率越差(cha)且形(xing)成發熱溫升(sheng)，傳統 使用LCR meter 1Khz 的(de)(de)(de)量測(ce)方法，只能評(ping)估出接(jie) 近Ro(趨(qu)近ACIR)的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)性(xing)傳導(dao)所形(xing)成的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)瞬(shun)間(jian) 電(dian)(dian)(dian)(dian)(dian)(dian)力出輸(shu)出阻(zu)礙(ai)，但(dan)無法評(ping)估在電(dian)(dian)(dian)(dian)(dian)(dian)化學轉態時所 產生(sheng)的(de)(de)(de)延遲，而基于圖三(san)之等(deng)效電(dian)(dian)(dian)(dian)(dian)(dian)路圖，DCIR的(de)(de)(de) 評(ping)估即包(bao)含(han)ACIR的(de)(de)(de)阻(zu)值。故動力電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)所使用的(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian) 池(chi)芯(xin)都應經過(guo)DCIR的(de)(de)(de)特性(xing)評(ping)估。DCIR的(de)(de)(de)評(ping)估方式(shi) 根據BS EN 61960的(de)(de)(de)精神，可以用此測(ce)試波形(xing)，利 用二個不(bu)同之加載電(dian)(dian)(dian)(dian)(dian)(dian)流之電(dian)(dian)(dian)(dian)(dian)(dian)流差(cha)與電(dian)(dian)(dian)(dian)(dian)(dian)壓差(cha)來(lai)計算(suan) DCIR值。

EDLC 測試條件之應用特性分類 
EDLC 之(zhi)測(ce)(ce)試為依照其產品(pin)之(zhi)實際應用(yong)(yong)(yong)來(lai)區分不同之(zhi)測(ce)(ce)試條件(jian)。按(an)IEC 62391法規之(zhi)分類(lei)，基本上 EDLC 之(zhi)產品(pin)應用(yong)(yong)(yong)分做四類(lei) 1. 記憶體備用(yong)(yong)(yong)電能(neng) 應用(yong)(yong)(yong)、2. 電力應用(yong)(yong)(yong)、3. 儲能(neng)應用(yong)(yong)(yong)、4. 瞬變電源應用(yong)(yong)(yong)。不同測(ce)(ce)試應用(yong)(yong)(yong)代表(biao)不同的(de)測(ce)(ce)試條件(jian)，而(er)測(ce)(ce)試者應選(xuan)擇合適的(de)測(ce)(ce)試設備與測(ce)(ce)試電流，與測(ce)(ce)試 設備之(zhi)精度。

EDLC 容量(Capacitance)測試曲線 
根據EDLC測(ce)試(shi)法(fa)規IEC 62391，在測(ce)試(shi)容(rong)(rong)量(liang)前，EDLC必需確定其(qi) 經過CV充(chong)電(dian)(dian)程(cheng)序并(bing)且已(yi)經完(wan)成(cheng)充(chong)電(dian)(dian)后，其(qi)容(rong)(rong)量(liang)測(ce)試(shi)是以上(shang)述放(fang)(fang) 電(dian)(dian)電(dian)(dian)流進行(xing)CC放(fang)(fang)電(dian)(dian)，放(fang)(fang)電(dian)(dian)程(cheng)序完(wan)成(cheng)后，取放(fang)(fang)電(dian)(dian)曲線(xian)上(shang)EDLC之額 定電(dian)(dian)壓(ya)(ya)的(de)(de)80%電(dian)(dian)壓(ya)(ya)點及額定電(dian)(dian)壓(ya)(ya)的(de)(de)40%電(dian)(dian)壓(ya)(ya)點，二點間(jian)的(de)(de)放(fang)(fang)電(dian)(dian)能 量(liang)與間(jian)距時間(jian)，來計(ji)算(suan)此EDLC的(de)(de)容(rong)(rong)量(liang)。

電池容量測試應用 
根據EDLC測(ce)(ce)試(shi)(shi)法(fa)規(gui)IEC 62391，同測(ce)(ce)試(shi)(shi)容量之步(bu)驟，EDLC必需確定(ding) 其(qi)經過CV充(chong)電(dian)(dian)程序并且已經完(wan)成充(chong)電(dian)(dian)后，其(qi)容量測(ce)(ce)試(shi)(shi)是以上述放 電(dian)(dian)電(dian)(dian)流進行CC放電(dian)(dian)，放電(dian)(dian)程序完(wan)成后，取放電(dian)(dian)曲線(xian)上線(xian)性的(de)區域(yu)之 線(xian)段(duan)，并延申至放電(dian)(dian)之時(shi)間點取其(qi)與(yu)額定(ding)電(dian)(dian)壓間之電(dian)(dian)壓差與(yu)放電(dian)(dian)電(dian)(dian) 流，來(lai)計算DCIR值。

Chroma 17011具(ju)備快速(su)輸出與量(liang)測(ce)(ce)記錄的(de)能(neng)力，高(gao)精準度的(de)規格保障測(ce)(ce)試(shi)品(pin)質，性能(neng)穩定適用于各種(zhong)需要(yao)可靠(kao)數據(ju)的(de)測(ce)(ce)試(shi)場合；彈(dan)性的(de)編程功(gong)能(neng)可針對(dui)各通(tong)道(dao)單獨下配(pei)(pei)方，各通(tong)道(dao)*獨立(li)測(ce)(ce)試(shi)運(yun)行(xing)。模組化多通(tong)道(dao)的(de)設(she)計架構，可依據(ju)測(ce)(ce)試(shi)需求數量(liang)作配(pei)(pei)置，同(tong)時(shi)，支(zhi)援通(tong)道(dao)并(bing)聯輸出功(gong)能(neng)，能(neng)彈(dan)性的(de)組合做更(geng)大電流測(ce)(ce)試(shi)，應用范圍涵蓋(gai)各類型大小容量(liang)的(de)單體鋰離子電池測(ce)(ce)試(shi)，或更(geng)大容量(liang)的(de)電池模組特性測(ce)(ce)試(shi)，不必因為產品(pin)差異而(er)購買多種(zhong)規格設(she)備，達到設(she)備高(gao)利用率。

Chroma 17011控制方式(shi)(shi)需以(yi)外部電(dian)(dian)(dian)(dian)腦連線進(jin)行(xing)，透過Ethernet通(tong)訊介面，可(ke)單獨的對(dui)各通(tong)道編程及控制，內(nei)建多種測(ce)(ce)試(shi)(shi)(shi)(shi)模式(shi)(shi)，可(ke)以(yi)實現CC-CV恒電(dian)(dian)(dian)(dian)流(liu)(liu)轉恒電(dian)(dian)(dian)(dian)壓、CC恒電(dian)(dian)(dian)(dian)流(liu)(liu)、CP恒功率的充電(dian)(dian)(dian)(dian)與放(fang)電(dian)(dian)(dian)(dian)測(ce)(ce)試(shi)(shi)(shi)(shi)，電(dian)(dian)(dian)(dian)池DCIR直流(liu)(liu)內(nei)阻測(ce)(ce)試(shi)(shi)(shi)(shi)，超電(dian)(dian)(dian)(dian)容的電(dian)(dian)(dian)(dian)容量測(ce)(ce)試(shi)(shi)(shi)(shi)、直流(liu)(liu)電(dian)(dian)(dian)(dian)阻測(ce)(ce)試(shi)(shi)(shi)(shi)；每種測(ce)(ce)試(shi)(shi)(shi)(shi)模式(shi)(shi)依(yi)據(ju)設定的時間(jian)、電(dian)(dian)(dian)(dian)壓、電(dian)(dian)(dian)(dian)流(liu)(liu)或功率條件作工步轉換；資(zi)料收集內(nei)容包含回傳測(ce)(ce)試(shi)(shi)(shi)(shi)工步、狀態(tai)、電(dian)(dian)(dian)(dian)壓、電(dian)(dian)(dian)(dian)流(liu)(liu)、容量等數(shu)據(ju)，采樣方式(shi)(shi)也有多種彈性可(ke)選擇，可(ke)依(yi)據(ju)時間(jian)、電(dian)(dian)(dian)(dian)壓、電(dian)(dian)(dian)(dian)流(liu)(liu)或容量的條件來決定 。

針對測(ce)試應用Chroma 17011做了(le)多項安全設計，在啟(qi)動測(ce)試前(qian)進行(xing)接觸(chu)檢查(cha)與極性檢查(cha)來確認回(hui)路狀(zhuang)態，確保充放電(dian)動作(zuo)安全，在測(ce)試過(guo)(guo)(guo)程(cheng)有過(guo)(guo)(guo)電(dian)壓(ya)、過(guo)(guo)(guo)電(dian)流、過(guo)(guo)(guo)容量、回(hui)路電(dian)阻等異常檢出功(gong)能，保障(zhang)測(ce)試過(guo)(guo)(guo)程(cheng)安全；另有資(zi)料保存機制，當遇到電(dian)腦短時(shi)異常與瞬時(shi)斷(duan)電(dian)異常可將資(zi)料保存于記(ji)憶體(ti)不(bu)遺失并(bing)記(ji)錄中(zhong)斷(duan)狀(zhuang)態，重新啟(qi)動后可選(xuan)擇(ze)繼(ji)續測(ce)試。

在電氣(qi)二重層(ceng)電容(EDLC)測(ce)試上(shang)提供內建(jian) IEC 62391(同EIAJ-2377)之(zhi)容量(liang)(Capacitance)及(ji)內阻(zu)(DCR)之(zhi)量(liang)測(ce)解決(jue)方(fang)案(an)，讓使(shi)用者(zhe)不必自(zi)行編寫計算(suan)式與資料(liao)統(tong)計，就可直接得到依據(ju)法規之(zhi)精神(shen)所計算(suan)的(de)容量(liang)與內阻(zu)值。

電池容量測試應用 
電(dian)池芯容量(liang)通常(chang)是(shi)以放(fang)電(dian)電(dian)流(liu)及時間(jian)兩個(ge)條件積分而(er)成(cheng)，故測(ce)試 容量(liang)時的放(fang)電(dian)電(dian)流(liu)將影響(xiang)zui后(hou)容量(liang)的測(ce)量(liang)，每(mei)顆電(dian)池雖有(you)制造商 標示之(zhi)規格，在(zai)其常(chang)用低充(chong)放(fang)電(dian)率來進行容量(liang)測(ce)試，但動力電(dian)池 應用經常(chang)在(zai)高于高充(chong)放(fang)電(dian)率狀(zhuang)態下在(zai)進行充(chong)電(dian)與放(fang)電(dian)。

若僅參(can)考 規(gui)格來(lai)設定電(dian)力電(dian)池的(de)容(rong)(rong)量將與實際容(rong)(rong)量有落差。在實務上(shang)需參(can) 考zui終(zhong)動(dong)力電(dian)池之充放電(dian)速率來(lai)針對其(qi)電(dian)池芯進行測試(shi)，將可得 到(dao)較準確(que)的(de)動(dong)力電(dian)池容(rong)(rong)量。

循還壽命測試

電池循環壽命測試應用 
電池(chi)(chi)(chi)之充(chong)(chong)放(fang)電使用壽(shou)命(ming)不(bu)只是動力(li)電池(chi)(chi)(chi)需(xu)要，所有電池(chi)(chi)(chi)芯產(chan)品都有 相同(tong)之測(ce)(ce)試(shi)條件(jian)(jian)(jian)(jian)，其測(ce)(ce)試(shi)是依照評(ping)(ping)估(gu)者先行(xing)定義的(de)(de)充(chong)(chong)放(fang)電條件(jian)(jian)(jian)(jian)做為(wei) 一個周期，反復測(ce)(ce)試(shi)同(tong)一顆(ke)電池(chi)(chi)(chi)芯，評(ping)(ping)估(gu)此(ci)電池(chi)(chi)(chi)直到測(ce)(ce)試(shi)終止(zhi)條件(jian)(jian)(jian)(jian) 到達前，正確(que)地執行(xing)過幾個周期，即為(wei)此(ci)電池(chi)(chi)(chi)之循環(huan)周期，而循環(huan) 周期次數愈多，代(dai)表(biao)此(ci)電池(chi)(chi)(chi)芯之壽(shou)命(ming)愈長(chang)。進而以同(tong)樣測(ce)(ce)試(shi)條件(jian)(jian)(jian)(jian)測(ce)(ce) 試(shi)不(bu)同(tong)種類的(de)(de)電池(chi)(chi)(chi)芯，來評(ping)(ping)估(gu)性能(neng)優劣，或用來評(ping)(ping)估(gu)某一產(chan)品zui適(shi) 合(he)的(de)(de)充(chong)(chong)放(fang)電條件(jian)(jian)(jian)(jian)與使用條件(jian)(jian)(jian)(jian)。

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